| 5968027a-0249-467d-8285-f753b709b472 |
ES 1010:2004
|
LIQUID CHEMICALS PRODUCTS - DETERMINATION OF HEPTANE MISCIBILITY OF LACQUER SOLVENT
|
MMMM yyyy
|
60.60
⇔ New
|
| 8d9248e8-45c5-4a8c-b0f3-02615976f6af |
ES 201:2001
|
SURFACE ACTIVE AGENTS- DETEREGENTS DETERMINATION OF TOTAL PHOSPHATES –TITRIMETRIC METHOD
|
MMMM yyyy
|
60.60
⇔ Systematic Review
|
| 1172ad69-db55-4404-b69d-33b92f95628f |
ES 5068:2017
|
SPECIFICATION FOR STABILIZED HYDROGEN PER OXIDE
|
MMMM yyyy
|
60.60
⇔ New
|
| 188d0c50-27de-402e-a99e-8559be5b54f9 |
ES 616:2001
|
LIQUID CHEMICAL PRODUCTS-DETERMINATION OF CLARITY OF SOLUTION
|
MMMM yyyy
|
60.60
⇔ New
|
| 04e44e2b-84d2-4530-8531-8853e2584617 |
ES 619:2001
|
LIQUID CHEMICAL PRODUCTS-DETERMINATION OF COLOUR
|
MMMM yyyy
|
60.60
⇔ New
|
| 7a7b14d0-567c-4170-8db0-ce1e914d5037 |
ES 620:2001
|
LIQUID CHEMICAL PRODUCTS-DETERMINATION OF BOILING POINT
|
MMMM yyyy
|
60.60
⇔ New
|
| 4e85b4f2-b42d-4ba8-b674-004d49d96b3e |
ES 626:2017
|
STANDARD TEST METHOD FOR WATER USING VOLUMETRIC KARL FISCHER TITRATION
|
MMMM yyyy
|
60.60
⇔ New
|
| bd02c8cc-efb1-4f14-b1a5-713fb1add2f0 |
ES 630:2017
|
STANDARD TEST METHODS FOR SPECIFIC GRAVITY, APPARENT, OF LIQUID INDUSTRIAL CHEMICALS
|
MMMM yyyy
|
60.60
⇔ New
|
| 582fd140-1819-4a59-9e70-9fc1d306824f |
ES 631:2017
|
STANDARD TEST METHOD FOR DENSITY OR RELATIVE DENSITY OF PURE LIQUID CHEMICALS
|
MMMM yyyy
|
60.60
⇔ New
|
| a72c82e7-c269-40ad-bb72-13057ec2841e |
ES 632:2017
|
STANDARD TEST METHOD FOR DETERMINATION OF ETHANOL AND METHANOL CONTENT IN FUELS CONTAINING GREATER THAN 20%ETHANOL BY GAS CHROMATOGRAPHY
|
MMMM yyyy
|
60.60
⇔ New
|
| 1c3a4e07-2bc5-4a82-b146-160452e57a6d |
ES 641:2017
|
STANDARD TEST METHOD FOR DENSITY, RELATIVE DENSITY, AND API GRAVITY OF LIQUIDS BY DIGITAL DENSITY METER
|
MMMM yyyy
|
60.60
⇔ New
|
| 27c3705b-24de-4f37-afd7-85a65ae5a35f |
ES ISO 10810:2022
|
SURFACE CHEMICAL ANALYSIS — X-RAY PHOTOELECTRON SPECTROSCOPY — GUIDELINES FOR ANALYSIS
|
MMMM yyyy
|
60.60
⇔ New
|
| 8b52bc76-3b04-4ae0-b61d-b934309dbcba |
ES ISO 11039:2013
|
SURFACE CHEMICAL ANALYSIS — SCANNING- PROBE MICROSCOPY — MEASUREMENT OF DRIFT RATE
|
MMMM yyyy
|
60.60
⇔ New
|
| b2e65f00-aa23-456d-b70b-c5c9deb2c885 |
ES ISO 12406:2013
|
SURFACE CHEMICAL ANALYSIS — SECONDARY-ION MASS SPECTROMETRY — METHOD FOR DEPTH PROFILING OF ARSENIC IN SILICON
|
MMMM yyyy
|
60.60
⇔ New
|
| 814f1701-78af-4347-abe5-4e3cf2ea58be |
ES ISO 13084:2022
|
SURFACE CHEMICAL ANALYSIS — SECONDARY-ION MASS SPECTROMETRY — CALIBRATION OF THE MASS SCALE FOR A TIME-OF-FLIGHT SECONDARY-ION MASS SPECTROMETER
|
MMMM yyyy
|
60.60
⇔ New
|
| 67fd122b-d5fc-45e5-b533-0add869b1c51 |
ES ISO 14167:2013
|
GAS ANALYSIS — GENERAL QUALITY ASSURANCE ASPECTS IN THE USE OF CALIBRATION GAS MIXTURES — GUIDELINES
|
MMMM yyyy
|
60.60
⇔ New
|
| bb1a7b46-2cb4-4391-aad5-20c68adc1d94 |
ES ISO 14187:2022
|
SURFACE CHEMICAL ANALYSIS — CHARACTERIZATION OF NANO STRUCTURED MATERIALS
|
MMMM yyyy
|
60.60
⇔ New
|
| b1524aff-91d6-4858-af80-1e5b574cbd44 |
ES ISO 14237:2013
|
SURFACE CHEMICAL ANALYSIS — SECONDARY-ION MASS SPECTROMETRY — DETERMINATION OF BORON ATOMIC CONCENTRATION IN SILICON USING UNIFORMLY DOPED MATERIALS
|
MMMM yyyy
|
60.60
⇔ New
|
| 13c8d2b5-507e-4c8a-8723-e633be2dcf3f |
ES ISO 14606:2022
|
SURFACE CHEMICAL ANALYSIS— SPUTTER DEPTH PROFILING— OPTIMIZATION USING LAYERED SYSTEMS AS REFERENCE MATERIALS
|
MMMM yyyy
|
60.60
⇔ New
|
| ca932c27-faa9-4565-a84b-c263ef01710a |
ES ISO 14707:2022
|
SURFACE CHEMICAL ANALYSIS — GLOW DISCHARGE OPTICAL EMISSION SPECTROMETRY (GD-OES) — INTRODUCTION TO USE
|
MMMM yyyy
|
60.60
⇔ New
|
| dc0f5db5-a0ae-42db-a22e-1cf04fa69c2f |
ES ISO 14912:2013
|
GAS ANALYSIS — CONVERSION OF GAS MIXTURE COMPOSITION DATA
|
MMMM yyyy
|
60.60
⇔ New
|
| 7fe02d9c-329c-4509-ab82-abffe2abe4cf |
ES ISO 14976:2013
|
SURFACE CHEMICAL ANALYSIS — DATA TRANSFER FORMAT
|
MMMM yyyy
|
60.60
⇔ New
|
| da1be935-045d-4a6a-aee3-6ae1235d6cfa |
ES ISO 15338:2013
|
SURFACE CHEMICAL ANALYSIS — GLOW DISCHARGE MASS SPECTROMETRY (GD-MS) — INTRODUCTION TO USE
|
MMMM yyyy
|
60.60
⇔ New
|
| b7a68a97-b3af-4d6c-8403-547785c3003e |
ES ISO 15470:2022
|
SURFACE CHEMICAL ANALYSIS — X-RAY PHOTOELECTRON SPECTROSCOPY — DESCRIPTION OF SELECTED INSTRUMENTAL PERFORMANCE PARAMETERS
|
MMMM yyyy
|
60.60
⇔ New
|
| 270f96bd-cedb-4ca5-968d-3c9e566f3a4d |
ES ISO 15471:2022
|
SURFACE CHEMICAL ANALYSIS — AUGER ELECTRON SPECTROSCOPY — DESCRIPTION OF SELECTED INSTRUMENTAL PERFORMANCE PARAMETERS
|
MMMM yyyy
|
60.60
⇔ New
|
| fc0c7d31-cee9-4ffc-907f-57fab7f1ff98 |
ES ISO 15472:2013
|
SURFACE CHEMICAL ANALYSIS — X-RAY PHOTOELECTRON SPECTROMETERS — CALIBRATION OF ENERGY SCALES
|
MMMM yyyy
|
60.60
⇔ New
|
| cfaf5b6c-0122-4cf6-aee4-0ea81b87c80b |
ES ISO 15796:2013
|
GAS ANALYSIS — INVESTIGATION AND TREATMENT OF ANALYTICAL BIAS
|
MMMM yyyy
|
60.60
⇔ New
|
| bc107cf6-c6c1-4abe-8b6c-05b6dcc5b44c |
ES ISO 15969:2013
|
SURFACE CHEMICAL ANALYSIS—DEPTH PROFILING—MEASUREMENT OF SPUTTERED DEPTH
|
MMMM yyyy
|
60.60
⇔ New
|
| c23ca675-c635-4461-b26a-1000c8c102ac |
ES ISO 16129:2013
|
SURFACE CHEMICAL ANALYSIS — X-RAY PHOTOELECTRON SPECTROSCOPY — PROCEDURES FOR ASSESSING THE DAY-TO-DAY PERFORMANCE OF AN X-RAY PHOTOELECTRON SPECTROMETER
|
MMMM yyyy
|
60.60
⇔ New
|
| c038040d-7441-4403-9961-07e3dc3bb43e |
ES ISO 16242:2013
|
SURFACE CHEMICAL ANALYSIS — RECORDING AND REPORTING DATA IN AUGER ELECTRONSPECTROSCOPY (AES)
|
MMMM yyyy
|
60.60
⇔ New
|
| 03cd43f2-f614-4c47-b83a-c8af6a93117d |
ES ISO 16664:2018
|
GAS ANALYSIS — HANDLING OF CALIBRATION GASES AND GAS MIXTURES — GUIDELINES
|
MMMM yyyy
|
60.60
⇔ New
|
| 68fa1127-0d31-4688-9f0f-6fa6c53ab2bd |
ES ISO 16962:2022
|
SURFACE CHEMICAL ANALYSIS —ANALYSIS OF ZINC- AND/OR ALUMINIUM-BASED METALLIC COATINGS BY GLOW-DISCHARGE OPTICAL-EMISSION SPECTROMETRY
|
MMMM yyyy
|
60.60
⇔ New
|
| c88fd53c-b1d6-4f05-9e1b-48a23d261988 |
ES ISO 17331:2013
|
SURFACE CHEMICAL ANALYSIS — CHEMICAL METHODS FOR THE COLLECTION OF ELEMENTS FROM THE SURFACE OF SILICON-WAFER WORKING REFERENCE MATERIALS AND THEIR DETERMINATION BY TOTAL-REFLECTION X-RAY FLUORESCENCE (TXRF) SPECTROSCOPY
|
MMMM yyyy
|
60.60
⇔ New
|
| faa0750f-00b8-4c53-95db-6fde71d60ec9 |
ES ISO 17560:2016
|
SURFACE CHEMICAL ANALYSIS — SECONDARY-ION MASS SPECTROMETRY — METHOD FOR DEPTH PROFILING OF BORON IN SILICON
|
MMMM yyyy
|
60.60
⇔ New
|
| 5ef1ce92-25c2-48b5-b2a9-b237c86ef7fb |
ES ISO 17973:2022
|
SURFACE CHEMICAL ANALYSIS — MEDIUM-RESOLUTION AUGER ELECTRON SPECTROMETERS —CALIBRATION OF ENERGY SCALES FOR ELEMENTAL ANALYSIS
|
MMMM yyyy
|
60.60
⇔ New
|
| eb14b453-4110-4fcc-89ed-d67c6150e4eb |
ES ISO 18114:2022
|
SURFACE CHEMICAL ANALYSIS — SECONDARY-ION MASS SPECTROMETRY — DETERMINATION OF RELATIVE SENSITIVITY FACTORS FROM ION-IMPLANTED REFERENCE MATERIALS
|
MMMM yyyy
|
60.60
⇔ New
|
| ee4af879-d9a2-4a70-ad2a-5911e634260f |
ES ISO 18115-1:2016
|
SURFACE CHEMICAL ANALYSIS — VOCABULARY —PART 1: GENERAL TERMS AND TERMS USED IN SPECTROSCOPY
|
MMMM yyyy
|
60.60
⇔ New
|
| adffb589-9d4b-4c2f-af25-0fdfdecfa659 |
ES ISO 18115-2:2016
|
SURFACE CHEMICAL ANALYSIS — VOCABULARY —PART 2: TERMS USED IN SCANNING-PROBE MICROSCOPY
|
MMMM yyyy
|
60.60
⇔ New
|
| b820e30e-10cc-42a9-958c-4ae21bed85a3 |
ES ISO 18116:2013
|
SURFACE CHEMICAL ANALYSIS— GUIDELINES FOR PREPARATION AND MOUNTING OF SPECIMENS FOR ANALYSIS
|
MMMM yyyy
|
60.60
⇔ New
|
| 6a892904-e291-4356-9240-52969a7a9884 |
ES ISO 18117:2013
|
SURFACE CHEMICAL ANALYSIS — HANDLING OF SPECIMENS PRIOR TO ANALYSIS
|
MMMM yyyy
|
60.60
⇔ New
|
| 57067890-bcc7-4521-b573-74fecda12787 |
ES ISO 18392:2013
|
SURFACE CHEMICAL ANALYSIS — X-RAY PHOTOELECTRON SPECTROSCOPY — PROCEDURES FOR DETERMINING BACKGROUNDS
|
MMMM yyyy
|
60.60
⇔ New
|
| 1498ae6f-4efa-4311-b351-f3f2b74a1e6e |
ES ISO 19318:2022
|
SURFACE CHEMICAL ANALYSIS —X-RAY PHOTOELECTRON SPECTROSCOPY —REPORTING OF METHODS USED FOR CHARGECONTROL AND CHARGE CORRECTION
|
MMMM yyyy
|
60.60
⇔ New
|
| 2b4ab1d7-5f10-417f-82c6-ac7608edb91e |
ES ISO 19319:2016
|
SURFACE CHEMICAL ANALYSIS — FUNDAMENTAL APPROACHES TO DETERMINATION OF LATERAL RESOLUTION AND SHARPNESS IN BEAM-BASED METHODS
|
MMMM yyyy
|
60.60
⇔ New
|
| ec19ba10-6187-4041-af04-7ff94a3059dc |
ES ISO 20341:2013
|
SURFACE CHEMICAL ANALYSIS— SECONDARY-ION MASS SPECTROMETRY— METHOD FOR ESTIMATING DEPTH RESOLUTION PARAMETERS WITH MULTIPLE DELTA-LAYER REFERENCE MATERIALS
|
MMMM yyyy
|
60.60
⇔ New
|
| dec716c7-1255-41f2-86b2-b17b59d3015c |
ES ISO 20903:2022
|
SURFACE CHEMICAL ANALYSIS — AUGER ELECTRON SPECTROSCOPY AND X.RAY PHOTOELECTRON SPECTROSCOPY — METHODS USED TO DETERMINE PEAK INTENSITIES AND INFORMATION REQUIRED WHEN REPORTING RESULTS
|
MMMM yyyy
|
60.60
⇔ New
|
| 26f6d094-1c28-4a4c-9a48-90faee0cd533 |
ES ISO 21079-1:2013
|
CHEMICAL ANALYSIS OF REFRACTORIES CONTAINING ALUMINA, ZIRCONIA AND SILICA — REFRACTORIES CONTAINING 5 % TO 45 % OF ZRO2 (ALTERNATIVE TO THE X-RAY FLUORESCENCE METHOD) —PART 1: APPARATUS, REAGENTS AND DISSOLUTION
|
MMMM yyyy
|
60.60
⇔ New
|
| 42a04de0-3537-49a7-936e-a08f86ebaaee |
ES ISO 21079-2:2013
|
CHEMICAL ANALYSIS OF REFRACTORIES CONTAINING ALUMINA, ZIRCONIA, AND SILICA — REFRACTORIES CONTAINING 5 % TO 45 % OF ZRO2 (ALTERNATIVE TO THE X-RAY FLUORESCENCE METHOD) — PART 2: WET CHEMICAL ANALYSIS
|
MMMM yyyy
|
60.60
⇔ New
|
| 3d8ef180-2139-417f-8ba8-81cb80c769ac |
ES ISO 2121:2013
|
LIQUID CHLORINE FOR INDUSTRIAL USE-DETERMINATION OF WATER CONTENT- GRAVIMETRIC METHOD
|
MMMM yyyy
|
60.60
⇔ New
|
| a2d5cdc7-7ba9-4b16-9d7b-2d68b52fa13e |
ES ISO 22048:2013
|
SURFACE CHEMICAL ANALYSIS — INFORMATION FORMAT FOR STATIC SECONDARY-ION MASS SPECTROMETRY
|
MMMM yyyy
|
60.60
⇔ New
|
| 9ec2f1fc-4fd9-44a1-8a3f-a7b62e98a48e |
ES ISO 22335:2013
|
SURFACE CHEMICAL ANALYSIS — DEPTH PROFILING — MEASUREMENT OF SPUTTERING RATE: MESH-REPLICA METHOD USING A MECHANICAL STYLUS PROFILOMETER
|
MMMM yyyy
|
60.60
⇔ New
|
| e66b67f2-f8aa-4c28-b171-e4bf85307ca6 |
ES ISO 23812:2013
|
SURFACE CHEMICAL ANALYSIS — SECONDARY-ION MASS SPECTROMETRY — METHOD FOR DEPTH CALIBRATION FOR SILICON USING MULTIPLE DELTA-LAYER REFERENCE MATERIALS
|
MMMM yyyy
|
60.60
⇔ New
|
| e27c3cd1-4c3f-49fd-bc2e-83b9e7e3be5c |
ES ISO 23830:2013
|
SURFACE CHEMICAL ANALYSIS — SECONDARY-ION MASS SPECTROMETRY — REPEATABILITY AND CONSTANCY OF THE RELATIVE-INTENSITY SCALE IN STATIC SECONDARY-ION MASS SPECTROMETRY
|
MMMM yyyy
|
60.60
⇔ New
|
| dc2b9731-3c69-4a03-a672-8d3da67a7c19 |
ES ISO 24236:2013
|
SURFACE CHEMICAL ANALYSIS — AUGER ELECTRON SPECTROSCOPY — REPEATABILITY AND CONSTANCY OF INTENSITY SCALE
|
MMMM yyyy
|
60.60
⇔ New
|
| faa7279f-e985-427c-9691-cbe7d58d414b |
ES ISO 24237:2013
|
SURFACE CHEMICAL ANALYSIS — X-RAY PHOTOELECTRON SPECTROSCOPY — REPEATABILITY AND CONSTANCY OF INTENSITY SCALE
|
MMMM yyyy
|
60.60
⇔ New
|
| 4e42e358-5672-4042-8bda-31fb8aeb155a |
ES ISO 25138:2022
|
SURFACE CHEMICAL ANALYSIS — ANALYSIS OF METAL OXIDE FILMS BY GLOW-DISCHARGE OPTICAL-EMISSION SPECTROMETRY
|
MMMM yyyy
|
60.60
⇔ New
|
| a941a07e-5636-4f8a-b3ee-fc3b5574f22b |
ES ISO 2590:2001
|
GENERAL METHOD FOR THE DETERMINATION OF ARSENIC-SILVER DIETHYLDITHIOCARBAMATE PHOTOMETRIC METHODEVAPORATION ON A WATER BATH - GENERAL METHOD
|
MMMM yyyy
|
60.60
⇔ New
|
| 2f56960b-1a49-40c7-87af-de1f1aed2f71 |
ES ISO 2718:2013
|
STANDARD LAYOUT FOR A METHOD OF CHEMICAL ANALYSIS BY GAS CHROMATOGRAPHY
|
MMMM yyyy
|
60.60
⇔ New
|
| c13657e9-cc80-4ccd-a4f3-de0149e2dba7 |
ES ISO 27911:2013
|
SURFACE CHEMICAL ANALYSIS — SCANNING-PROBE MICROSCOPY — DEFINITION AND CALIBRATION OF THE LATERAL RESOLUTION OF A NEAR-FIELD OPTICAL MICROSCOPE
|
MMMM yyyy
|
60.60
⇔ New
|
| 0c1901d5-172b-47da-bbd3-229bc8ad9547 |
ES ISO 28600:2013
|
SURFACE CHEMICAL ANALYSIS — DATA TRANSFER FORMAT FOR SCANNING-PROBE MICROSCOPY
|
MMMM yyyy
|
60.60
⇔ New
|
| 96bb7be5-c91c-405e-a822-e0dd46576418 |
ES ISO 29041:2013
|
GAS MIXTURES — GRAVIMETRIC PREPARATION — MASTERING CORRELATIONS IN COMPOSITION
|
MMMM yyyy
|
60.60
⇔ New
|
| d46c6630-11d4-450a-bb18-8bd70393f8ad |
ES ISO 3165:2001
|
SAMPLING OF CHEMICAL PRODUCTS FOR INDUSTRIAL USE- SAFETY IN SAMPLING
|
MMMM yyyy
|
60.60
⇔ New
|
| cb1674ed-8f9e-49f6-be93-b5daf58e8f66 |
ES ISO 5790:2001
|
INORGANIC CHEMICAL PRODUCTS FOR INDUSTRIAL FOR USE GENERAL METHOD FOR DETERMINATION OF CHLORIDE CONTENT-MERCURIMETRIC METHOD
|
MMMM yyyy
|
60.60
⇔ New
|
| be8f5965-caa1-4f31-83ef-c24ba17ac4fd |
ES ISO 6141:2022
|
GAS ANALYSIS — CONTENTS OF CERTIFICATES FOR CALIBRATION GAS MIXTURES
|
MMMM yyyy
|
60.60
⇔ Systematic Review
|
| 951aded6-4faa-4c09-8f38-92b066451cd4 |
ES ISO 6142:2013
|
GAS ANALYSIS - PREPARATION OF CALIBRATION GAS MIXTURES - GRAVIMETRIC METHOD AMENDMENT1LIQUID INTRODUCTION
|
MMMM yyyy
|
60.60
⇔ New
|
| a74df9cc-0632-493a-b8ee-2c430712c7de |
ES ISO 6143:2013
|
GAS ANALYSIS - COMPARISON METHODS FOR DETERMINING AND CHECKING THE COMPOSITION OF CALIBRATION GAS MIXTURES
|
MMMM yyyy
|
60.60
⇔ New
|
| 5bc6b954-bc1d-4ad8-a46e-34ffe5ca35d4 |
ES ISO 6144:2013
|
GAS ANALYSIS - PREPARATION OF CALIBRATION GAS MIXTURES – STATIC VOLUMETRIC METHOD
|
MMMM yyyy
|
60.60
⇔ New
|
| 1d7098a5-d1dd-4227-b22b-bb3accf3ef6e |
ES ISO 6145-1:2013
|
GAS ANALYSIS - PREPARATION OF CALIBRATION GAS MIXTURES USING DYNAMIC VOLUMETRIC METHODS - PART 1:METHODS OF CALIBRATION
|
MMMM yyyy
|
60.60
⇔ New
|
| 8f17486e-ab42-4c70-9a02-4495821f1bbe |
ES ISO 6145-11:2013
|
GAS ANALYSIS - PREPARATION OF CALIBRATION GAS MIXTURES USING DYNAMIC VOLUMETRIC METHODS PART 11:ELECTROCHEMICAL GENERATION
|
MMMM yyyy
|
60.60
⇔ New
|
| 2bfe5d5d-b62c-4109-a590-078d03f2f61a |
ES ISO 6145-4:2013
|
GAS ANALYSIS - PREPARATION OF CALOBRATION GAS MIXTURES USING DYNAMIC VOLUMETRIC METHODS - PART 4:COMTINOUS SYRINGE INJECTION METHOD
|
MMMM yyyy
|
60.60
⇔ New
|
| 2c8cd0e1-2fe5-4e42-8870-7e397fa5ad3c |
ES ISO 6145-5:2013
|
GAS ANALYSIS - PREPARATION OF CALIBRATION GAS MIXTURES USING DYNAMIC VOLUMETRIC METHODS - PART 5: CAPILLARY CALIBRATION DEVICES
|
MMMM yyyy
|
60.60
⇔ New
|
| 1130e0a6-43c0-41b3-b627-481987ade773 |
ES ISO 6145-6:2013
|
GAS ANALYSIS - PREPARATION OF CALIBRATION GAS MIXTURES USING DYNAMIC VOLUMETRIC METHODS - PART 6: CRITICAL ORIFICES
|
MMMM yyyy
|
60.60
⇔ New
|
| f07e7c84-d87b-4793-8633-a34dddd1e311 |
ES ISO 6145-7:2013
|
GAS ANALYSIS -PREPARATION OF CALIBRATION GAS MIXTURES USING DYNAMIC VOLUMETRIC METHODS PART 7:THERMAL MASS- FLOW CONTROLLERS
|
MMMM yyyy
|
60.60
⇔ New
|
| 77f5fee9-8914-4f52-a3ab-af549e146691 |
ES ISO 6145-8:2013
|
GAS ANALYSIS - PREPARATION OF CALIBRATION GAS MIXTURES USING DYNAMIC VOLUMETRIC METHODS - PART 8:DIFFUSION METHOD
|
MMMM yyyy
|
60.60
⇔ New
|
| 5beb3528-8b2d-43c3-a7bc-aab8ff658b50 |
ES ISO 6145-9:2013
|
GAS ANALYSIS - PREPARATION OF CALIBRATION GAS MIXTURES USING DYNAMIC VOLUMETRIC METHODS - PART 9:SATURATION METHOD
|
MMMM yyyy
|
60.60
⇔ New
|
| ad43c9ee-7258-4256-8178-332eabb6c3db |
ES ISO 6206:2000
|
CHEMICAL PRODUCTS FOR INDUSTRIAL USE SAMPLING - VOCABULARY
|
MMMM yyyy
|
60.60
⇔ Systematic Review
|
| 26ad34c8-14fc-4228-a297-1df53cc06f04 |
ES ISO 6227:2013
|
CHEMICAL PRODUCTS FOR INDUSTRIAL USE-GENERAL METHOD FOR DETERMINATION OF CHLORIDE OF CHLORIDES IONS-POTENTIOMETRIC METHOD
|
MMMM yyyy
|
60.60
⇔ New
|
| a9509986-c96d-491b-999c-2a02067a6cb2 |
ES ISO 6228:2013
|
CHEMICAL PRODUCTS FOR INDUSTRIAL USE -GENERAL METHOD FOR DETERMINATION OF TRACES OF SULPHUR COMPOUNDS, AS SULPHATE,BY REDUCTION AND TITRIMETRY
|
MMMM yyyy
|
60.60
⇔ New
|
| e7a25e98-27ac-4315-ac6c-0710c407b7d2 |
ES ISO 6382:2013
|
GENERAL METHOD FOR DETERMINATION OF SILICON CONTENT - REDUCED MOLYBDOSILICATE SPECTROPHOTOMETRIC
|
MMMM yyyy
|
60.60
⇔ New
|
| bddb8e95-26f4-4758-ae93-9b754ff67b69 |
ES ISO 6685:2001
|
CHEMICAL PRODUCTS FOR INDUSTRIAL USE GENERAL METHOD FOR DETERMINATION OF IRON CONTENTS
|
MMMM yyyy
|
60.60
⇔ New
|
| 2dbec6fd-0a33-46e5-9004-2123447e67b9 |
ES ISO 78-2:2013
|
CHEMISTRY — LAYOUTS FOR STANDARDS — PART 2: METHODS OF CHEMICAL ANALYSIS
|
MMMM yyyy
|
60.60
⇔ New
|